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Alternate Methodology for Measuring Loss Tangent of PCB Laminates
April 28, 2010 |Estimated reading time: Less than a minute
In a limited-scope laminate study, SUN Microsystems has looked at the dielectric loss tangent of a few materials. It became apparent that no one method that we looked at could accurately measure Df alone over a sufficiently wide band of frequencies due to various limitation of the associated method.
This paper, which won a Best Paper Award at DesignCon 2010, was written by Istvan Novak, Kevin Hinckley, Gregory Truhlar, Douglas Winterberg, Gustavo Blando, Jason R. Miller, Roger Dame and Alexander Nosovitski of SUN Microsystems, and Mike Ballou and Shelley Begley of Agilent Technologies.
Click here to read.