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Differential PCB Structures Using Measured TRL Calibration and Simulated Structure
August 13, 2008 |Estimated reading time: Less than a minute
A combined through-reflect-line (TRL) calibration and de-embedding procedure based on measured and computed data can be used to extract accurate S-parameters of differential structures in multilayer PCBs. This paper, presented at DesignCon 2007, was written by Heidi Barnes, Verigy Inc.; Dr. Antonio Ciccomancini, CST of America; Mike Resso, Agilent Technologies; and Ming Tsai, Xilinx. Click here to read.